Preparation and structure characterization of CeO2 films on stainless steel substrates deposited by laser ablation with Ar+ ion beam assistance

Xintang Huang; You-qing Wang; Qiulang Wang; Qingming Chen; Qiyang Xu; Zhongke Wang

doi:10.1117/12.361118

8 September 1999 Preparation and structure characterization of CeO₂ films on stainless steel substrates deposited by laser ablation with Ar⁺ ion beam assistance

Xintang Huang, You-qing Wang, Qiulang Wang, Qingming Chen, Qiyang Xu, Zhongke Wang

Author Affiliations +

Proceedings Volume 3862, 1999 International Conference on Industrial Lasers; (1999) https://doi.org/10.1117/12.361118
Event: International Symposium on Industrial Lasers, 1999, Wuhan, China

Abstract

The CeO₂ films were deposited by pulsed laser ablation on stainless steel substrates at room temperature with the Ar⁺ ion beam assistance. The results show that when the CeO₂ films were deposited directly on the stainless steel substrates, the desired (001)-normal textured were achieved, but there was no evidence for alignment of in- plane crystal axes. Further experimental results indicate that CeO₂/YSZ (Yttria-Stabilized Zirconia)/stainless steel films deposited under the same conditions are not only normal orientation to the substrate's surface but also highly in-plane textured.

Citation Download Citation

Xintang Huang, You-qing Wang, Qiulang Wang, Qingming Chen, Qiyang Xu, and Zhongke Wang "Preparation and structure characterization of CeO₂ films on stainless steel substrates deposited by laser ablation with Ar⁺ ion beam assistance", Proc. SPIE 3862, 1999 International Conference on Industrial Lasers, (8 September 1999); https://doi.org/10.1117/12.361118

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