Paper
2 May 2000 Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy
Noel Axelrod, Anna Radko, Nissim Ben-Yosef, Artium Khatchatouriants, Millet Treinin, Aaron Lewis
Author Affiliations +
Abstract
We demonstrate that near-field optical and atomic force microscopy data can be used for super-resolution 3D image restoration in optical sectioning fluorescence microscopy. A crucial feature in this approach is the full integration of such data sets with digital far-field images. The scanned probe data is used to provide modalities for boundary constraints which define surface optical information and spatial domains of optical alterations in a sample with a spatial precision that has been unachievable in the past. A restoration algorithm that can use such a complex of data for 3D image deconvolution is presented. It uses a Tikhonov- Miller regularization scheme and allows for the imposition of different types of constraints to obtain super-resolution deconvolved images. Performance was tested by using simulated 3D imaging. An example is given of the restoration of a 3D wide field optical image of a biological specimen in the presence of atomic force constraints.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Noel Axelrod, Anna Radko, Nissim Ben-Yosef, Artium Khatchatouriants, Millet Treinin, and Aaron Lewis "Near-field optical and atomic force constraints for superresolution 3D deconvolution in far-field optical microscopy", Proc. SPIE 3919, Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII, (2 May 2000); https://doi.org/10.1117/12.384191
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Cited by 2 scholarly publications.
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KEYWORDS
Near field optics

Charge-coupled devices

3D image processing

Image restoration

Near field

Super resolution

3D image restoration

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