Near-infrared wavemeter based on an array of polycrystalline Ge-on-Si photodetectors

Gianlorenzo Masini; Lorenzo Colace; Gaetano Assanto

doi:10.1117/12.379601

15 March 2000 Near-infrared wavemeter based on an array of polycrystalline Ge-on-Si photodetectors

Gianlorenzo Masini, Lorenzo Colace, Gaetano Assanto

Proceedings Volume 3953, Silicon-based Optoelectronics II; (2000) https://doi.org/10.1117/12.379601
Event: Symposium on Integrated Optoelectronics, 2000, San Jose, CA, United States

Abstract

We report on a novel solid state wavelength meter in the near infrared. The device is an array of six photodetectors based on polycrystalline germanium film evaporated on a silicon substrate and each element is a wavelength sensitive detector. We describe the design, the fabrication and the characterization of such device and we demonstrate its capability in the measurement of the wavelength of quasi- monochromatic light beams.

Citation Download Citation

Gianlorenzo Masini, Lorenzo Colace, and Gaetano Assanto "Near-infrared wavemeter based on an array of polycrystalline Ge-on-Si photodetectors", Proc. SPIE 3953, Silicon-based Optoelectronics II, (15 March 2000); https://doi.org/10.1117/12.379601

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available