Finding the information of the ellipse from the optical Hough transform

Sang-Gug Park; Sung-Young Kim; Jong-Yun Kim; Soo-Joong Kim

doi:10.1117/12.381612

31 March 2000 Finding the information of the ellipse from the optical Hough transform

Sang-Gug Park, Sung-Young Kim, Jong-Yun Kim, Soo-Joong Kim

Proceedings Volume 4043, Optical Pattern Recognition XI; (2000) https://doi.org/10.1117/12.381612
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

A new method to find five parameters of an ellipse from the optical Hough transform results is described. The method employs the Hough transform for detection of a straight line and the 1D analysis of the resultant parameter domain. By using this algorithm, we simulated about the ellipses with different positions, and we obtained the information of the ellipse with 94% accuracy in the worst case. To compare the simulation results with the experimental results, we performed optical experiments by using a HT CGH filter. Through the experiments, we showed that our results were very similar to those of the simulation results.

Citation Download Citation

Sang-Gug Park, Sung-Young Kim, Jong-Yun Kim, and Soo-Joong Kim "Finding the information of the ellipse from the optical Hough transform", Proc. SPIE 4043, Optical Pattern Recognition XI, (31 March 2000); https://doi.org/10.1117/12.381612

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