Comparison of nondestructive and noninvasive material depth profiling using FT-Raman fiber optics and microspectroscopy

Christian P. Schultz; Richard S. Jackson

doi:10.1117/12.390625

6 July 2000 Comparison of nondestructive and noninvasive material depth profiling using FT-Raman fiber optics and microspectroscopy

Christian P. Schultz, Richard S. Jackson

Author Affiliations +

Proceedings Volume 4129, Subsurface Sensing Technologies and Applications II; (2000) https://doi.org/10.1117/12.390625
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

The purpose of this study is to obtain chemical information from complex materials at different depths, without destroying the structure, by using a FT-Raman fiber-optic probe. This concept combines the flexibility of a fiber- optic probe with depth profiling capabilities similar to those of a confocal microscopy. The fact that the numerical aperture of the probe is lower than in microscope objectives explains the improvement in the range of depth penetration, from micrometers to millimeters, as well as the loss observed in depth resolution. Since the design of the filtered probe is based on confocal optics, it is possible to guide the focus through 6 - 7 mm thick material thereby providing detailed chemical information on different layers at different depths. The confocal properties of the fiber optic probe have been characterized by profiling a 6 micrometer polystyrene film, and comparing the results with those obtained on a FT-Raman microscope. We will present results of molecular depth profiling studies on multi-layer sheets of different polymers, including the determination of chromatic shift, layer thickness and polymer chemistry. Applications on other material depth profiling will also be discussed.

Citation Download Citation

Christian P. Schultz and Richard S. Jackson "Comparison of nondestructive and noninvasive material depth profiling using FT-Raman fiber optics and microspectroscopy", Proc. SPIE 4129, Subsurface Sensing Technologies and Applications II, (6 July 2000); https://doi.org/10.1117/12.390625

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available