Paper
9 October 2000 New advance in laser interferometry
Chunyong Yin, Zhixia Chao, Sai Gao, Hong Jiang, Jin Sun
Author Affiliations +
Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402620
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China
Abstract
Modern technology development requires interferometry of uttermost quality, which is characterized as high measurement speed, large measurement range, low drift and super-high resolution, good accuracy and efficiency. Firstly this paper introduces a frequency stabilized laser with 5MHz beat frequency which is based on the bi-reflection principle, and a high measurement speed dual-frequency laser interferometer whose allowable displacement velocity is over 1m/s using this kind of laser. Secondly it introduces a transverse Zeeman frequency stabilized laser with 300KHz beat frequency and its applications in nanometer measurement, collimation, coaxiality measurement, roll angle measurement and biomembrane measurement. Thirdly a tunable 633nm external-cavity diode laser (ECL) interferometer is presented.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chunyong Yin, Zhixia Chao, Sai Gao, Hong Jiang, and Jin Sun "New advance in laser interferometry", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402620
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KEYWORDS
Interferometers

Laser stabilization

Semiconductor lasers

Heterodyning

Laser interferometry

Reflection

Polarization

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