Paper
27 April 2001 Growth, crystallization, and room temperature photoluminescence of Er2O3 thin films
Kevin M. Chen, Sajan Saini, Michal Lipson, Xiaoman Duan, Lionel C. Kimerling
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Abstract
Room temperature photoluminescence (RT PL) has been obtained from Er2O3 thin films fabricated via reactive sputtering of Er metal in Ar/O2 and subsequently annealed. Upon annealing, the PL spectra develop maxima at 1549 nm and 1541 nm for films treated at 650 degrees C and 1020 degrees C, respectively. Crystallization at high temperature results in RT PL and a lifetime of approximately 10 ms at 4K.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kevin M. Chen, Sajan Saini, Michal Lipson, Xiaoman Duan, and Lionel C. Kimerling "Growth, crystallization, and room temperature photoluminescence of Er2O3 thin films", Proc. SPIE 4282, Rare-Earth-Doped Materials and Devices V, (27 April 2001); https://doi.org/10.1117/12.424773
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Cited by 4 scholarly publications.
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KEYWORDS
Crystals

Luminescence

Erbium

Annealing

Refractive index

Thin films

Active optics

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