Recording power tolerance of magneto-optical media on RIE-formed substrate using NA 0.85 and 407-nm optics

Takeshi Miki; Tetsuhiro Sakamoto; Ariyoshi Nakaoki; Masanobu Yamamoto

doi:10.1117/12.453386

10 January 2002 Recording power tolerance of magneto-optical media on RIE-formed substrate using NA 0.85 and 407-nm optics

Takeshi Miki, Tetsuhiro Sakamoto, Ariyoshi Nakaoki, Masanobu Yamamoto

Author Affiliations +

Proceedings Volume 4342, Optical Data Storage 2001; (2002) https://doi.org/10.1117/12.453386
Event: Optical Data Storage, 2001, Santa Fe, NM, United States

Abstract

To realize high density magneto-optical recording, it is important to suppress the disk noise. As we have reported, UV irradiation before sputtering films on the substrate could suppress the disk noise. But UV irradiation changed the shape of land and groove. We found that it caused poor recording power tolerance, because cross-talk could not be canceled using the phase compensation method. We developed a substrate formed by using a RIE process. Using this RIE-formed substrate, we could suppress the disk noise without UV-irradiation and improve the recording power tolerance.

Citation Download Citation

Takeshi Miki, Tetsuhiro Sakamoto, Ariyoshi Nakaoki, and Masanobu Yamamoto "Recording power tolerance of magneto-optical media on RIE-formed substrate using NA 0.85 and 407-nm optics", Proc. SPIE 4342, Optical Data Storage 2001, (10 January 2002); https://doi.org/10.1117/12.453386

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