Paper
1 February 2001 Technique of computer analysis of thermally stimulated depolarization currents
Sergey N. Koykov, Yury A. Panteleev, Elena A. Rodionova
Author Affiliations +
Proceedings Volume 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2001) https://doi.org/10.1117/12.417688
Event: Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2000, St. Petersburg, Russian Federation
Abstract
In this paper a technique of fitting of experimental data of thermally stimulated depolarization (TSD) (one of the widespread methods of dielectrics and high resistance semiconductors investigation, including parts of electrotechnical devices) is proposed. Theoretical substantiation and practical application of new methods of computer simulation for analysis of TSD currents are considered. Specific examples of experimental data fitting are given. Edges of the technique are shown. Some methods of computer simulation are recommended to experimenters for wide use.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey N. Koykov, Yury A. Panteleev, and Elena A. Rodionova "Technique of computer analysis of thermally stimulated depolarization currents", Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); https://doi.org/10.1117/12.417688
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KEYWORDS
Thulium

Dielectrics

Computer simulations

Analytical research

Statistical analysis

Temperature metrology

Electrodes

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