Paper
7 March 2001 Application of computer-processed video signal in the optics of thin films
Ludek Bartonek, Jiri Keprt
Author Affiliations +
Proceedings Volume 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics; (2001) https://doi.org/10.1117/12.417828
Event: 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 2000, Velke Losiny, Czech Republic
Abstract
The interferometric measurement method of a thin film optical thickness is presented in this report. This measurement is realized by Michelson's interferometer. Interferogram of a measured sample with one half of the surface covered by a laser and the other without a layer is digitally recorded from the screen by CCD camera. The video- signal from two rows of the intensity distribution from the part with and without a layer are numerically filtered via fast Fourier transformation and the phase change of the two periodical 'continuous' functions is evaluated by the first and second derivatives. This phase change allows to determine the path difference and finally the optical thickness of the layer.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ludek Bartonek and Jiri Keprt "Application of computer-processed video signal in the optics of thin films", Proc. SPIE 4356, 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, (7 March 2001); https://doi.org/10.1117/12.417828
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KEYWORDS
Thin films

CCD cameras

Image processing

Michelson interferometers

Mirrors

Glasses

Video

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