Electronic speckle pattern interferometry based on spatial fringe analysis method

Yasuhiko Arai; Shunsuke Yokozeki

doi:10.1117/12.445547

23 October 2001 Electronic speckle pattern interferometry based on spatial fringe analysis method

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design; (2001) https://doi.org/10.1117/12.445547
Event: Lasers in Metrology and Art Conservation, 2001, Munich, Germany

Abstract

The influence of the speckle size to the measurement accuracy is investigated by discussing the spatial frequency distribution of the signal of specklegrams on the Fourier domain with the results of experiments and computer simulations. It is found out that the relationship of the location between the distribution of noise element and of signal element of fringe images in the spatial frequency domain is related to the measurement accuracy. From these discussions, we would conclude as follows: the measurement accuracy is decreased, because the noise element in the specklegram increases when the speckle size is bigger than the size of the pixel of the CCD. On the other hand, there are many speckles in single pixel of the CCD in the case that the speckle size is smaller than the size of the pixel. Consequently, because the output of each pixel of the CCD is averaged with the intensity of each speckle in one pixel, this averaging effect of the intensities of speckles would bring the decrease of the measuring accuracy. The results show that the measurement accuracy of this method is maximized in the case that the speckle size is as large as the pixel size of the CCD.

Citation Download Citation

Yasuhiko Arai and Shunsuke Yokozeki "Electronic speckle pattern interferometry based on spatial fringe analysis method", Proc. SPIE 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design, (23 October 2001); https://doi.org/10.1117/12.445547

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