Paper
8 May 2001 Dynamic measurement of plastic deformation field by ESPI
Satoru Toyooka, Qing-Chuan Zhang, V. Madjarova, - Suprapedi, Rini Widiastuti
Author Affiliations +
Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.427024
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
Abstract
In this paper, a dual-beam in-plane sensitive electronic speckle pattern interferometry (ESPI) is applied to observe the degradation process of aluminum alloy plates under loading conditions. A quantitative phase analysis is performed using an addition-subtraction method.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Satoru Toyooka, Qing-Chuan Zhang, V. Madjarova, - Suprapedi, and Rini Widiastuti "Dynamic measurement of plastic deformation field by ESPI", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); https://doi.org/10.1117/12.427024
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KEYWORDS
Speckle

Fringe analysis

Interferometry

Aluminum

Speckle pattern

Camera shutters

Analytical research

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