Complex permittivity and permeability characterization from transmission-line measurements

Juan Hinojosa

doi:10.1117/12.450175

27 November 2001 Complex permittivity and permeability characterization from transmission-line measurements

Juan Hinojosa

Proceedings Volume 4491, Subsurface and Surface Sensing Technologies and Applications III; (2001) https://doi.org/10.1117/12.450175
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Two broadband methods for simultaneously measuring the complex values of the permittivity and permeability of film-shaped materials are presented. The complex properties of these materials are calculated from S-parameter measurements of coplanar or microstrip cells propagating the quasi-TEM dominant mode. The S-parameter measurements are easy to be implement. They are carried out from a network analyzer and on-wafer systems allowing different sizes of cell and covering 0.05-40 GHz. In the case of the coplanar, the dispersion is very low for a cell shape such as h>W+2S. Thus, a fast extraction method of the coplanar substrate properties ((epsilon) _r,(mu) _r ) has been developed from analytical relationships. It is faster than the microstrip extraction method, which requires a numerical method for a rigorous analysis of the microstrip cell in order to take into account the quasi-TEM mode dispersion. Measured (epsilon) _r and (mu) _r data for several materials are presented in the 0.05 GHz to 40 GHz frequency range. These methods show good agreement between measured and predicted values.

Citation Download Citation

Juan Hinojosa "Complex permittivity and permeability characterization from transmission-line measurements", Proc. SPIE 4491, Subsurface and Surface Sensing Technologies and Applications III, (27 November 2001); https://doi.org/10.1117/12.450175

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