Current and ultimate limitations of scanning x-ray nanotomography

Ian McNulty

doi:10.1117/12.450234

13 December 2001 Current and ultimate limitations of scanning x-ray nanotomography

Ian McNulty

Proceedings Volume 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II; (2001) https://doi.org/10.1117/12.450234
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

X-ray nanotomography has developed into a powerful new tool for three-dimensional structural analysis. The scanning approach offers capabilities that are competitive with full- field imaging. Current and ultimate limitations of nanotomography are examined in light of recent work.

Citation Download Citation

Ian McNulty "Current and ultimate limitations of scanning x-ray nanotomography", Proc. SPIE 4499, X-Ray Micro- and Nano-Focusing: Applications and Techniques II, (13 December 2001); https://doi.org/10.1117/12.450234

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