AFM and optical methods in determining roughness of SERS-active silver electrodes

Stefan Kruszewski; T. Kobiela

doi:10.1117/12.435960

10 August 2001 AFM and optical methods in determining roughness of SERS-active silver electrodes

Stefan Kruszewski, T. Kobiela

Proceedings Volume 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light; (2001) https://doi.org/10.1117/12.435960
Event: Lightmetry, 2000, Pultusk, Poland

Abstract

The results of optical and AFM measurements of SERS-active silver electrodes are presented. The intensity of specularly reflected light from these electrodes was measured and next, the rms roughness determined. The rms roughness of these electrodes were also determined from their AFM profiles. The origins of observed divergences are discussed.

Citation Download Citation

Stefan Kruszewski and T. Kobiela "AFM and optical methods in determining roughness of SERS-active silver electrodes", Proc. SPIE 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, (10 August 2001); https://doi.org/10.1117/12.435960

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