Angular characteristics of a silicon detector spectral sensitivity corrected by an absorption filter

Irena Fryc

doi:10.1117/12.435991

10 August 2001 Angular characteristics of a silicon detector spectral sensitivity corrected by an absorption filter

Irena Fryc

Proceedings Volume 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light; (2001) https://doi.org/10.1117/12.435991
Event: Lightmetry, 2000, Pultusk, Poland

Abstract

In this paper the results of measurements of the spectral sensitivity of a silicon detector fitted with a filter for spectral correction are presented. The measurements were made at various angles of incidence of a monochromatic luminous flux on the same surface of the spectral correction filter. The effect of the luminous flux angle of incidence on the spectral sensitivity of the system, detector -- correction filter, was studied. In addition, the errors resulting from changes in spectral sensitivity were determined quantitatively.

Citation Download Citation

Irena Fryc "Angular characteristics of a silicon detector spectral sensitivity corrected by an absorption filter", Proc. SPIE 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, (10 August 2001); https://doi.org/10.1117/12.435991

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