Paper
29 May 2002 Single-pattern phase-shift technique in scatter light method
Xinhua Ji, Jun Li, Jin-Long Chen, Yuwen Qin
Author Affiliations +
Proceedings Volume 4537, Third International Conference on Experimental Mechanics; (2002) https://doi.org/10.1117/12.468852
Event: Third International Conference on Experimental Mechanics, 2002, Beijing, China
Abstract
In the paper a new birefringent phase shift method is presented, which can distinct the isodyne images by the carrier fringes related with the material uniform initial birefringence. The theory and the technique of the new method are described. The computer generated isodyne images with carrier fringes are applied to explain the method.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xinhua Ji, Jun Li, Jin-Long Chen, and Yuwen Qin "Single-pattern phase-shift technique in scatter light method", Proc. SPIE 4537, Third International Conference on Experimental Mechanics, (29 May 2002); https://doi.org/10.1117/12.468852
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KEYWORDS
Light scattering

Birefringence

Phase shifts

Image processing

CCD cameras

Laser optics

Stress analysis

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