Diode laser testing by taking advantage of its photoelectric properties

Jens Wolfgang Tomm; A. Gerhardt; Dirk Lorenzen; P. Henning; H. Roehle

doi:10.1117/12.462652

16 April 2002 Diode laser testing by taking advantage of its photoelectric properties

Jens Wolfgang Tomm, A. Gerhardt, Dirk Lorenzen, P. Henning, H. Roehle

Proceedings Volume 4648, Test and Measurement Applications of Optoelectronic Devices; (2002) https://doi.org/10.1117/12.462652
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States

Abstract

We report on the potential of the photocurrent technique as analytical tool for diode laser testing. The physics involved into the generation of photocurrents as well as experimental requirements for detecting them are highlighted. Based on a number of practical examples, we demonstrate how knowledge about the photoelectrical properties of diode lasers can help to learn about stress and defects within packaged devices or how non-perfect device fabrication may be discovered. These results are discussed in conjunction with device reliability issues.

Citation Download Citation

Jens Wolfgang Tomm, A. Gerhardt, Dirk Lorenzen, P. Henning, and H. Roehle "Diode laser testing by taking advantage of its photoelectric properties", Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, (16 April 2002); https://doi.org/10.1117/12.462652

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