Possibility of determination of parameters of nanolayers by the modified Kretchman's scheme

Valery A. Karpenko; Aleksei A. Romanenko

doi:10.1117/12.464472

1 April 2002 Possibility of determination of parameters of nanolayers by the modified Kretchman's scheme

Valery A. Karpenko, Aleksei A. Romanenko

Proceedings Volume 4750, ICONO 2001: Quantum and Atomic Optics, High-Precision Measurements in Optics, and Optical Information Processing, Transmission, and Storage; (2002) https://doi.org/10.1117/12.464472
Event: XVII International Conference on Coherent and Nonlinear Optics (ICONO 2001), 2001, Minsk, Belarus

Abstract

It is shown that modification of Kretchman's scheme by deposition of dielectric thin film on the metal layer allows the sensitivity of the device to adsorbed layers to be increased. An analytical solution of the inverse problem of adsorbed layer parameters determination is obtained.

Citation Download Citation

Valery A. Karpenko and Aleksei A. Romanenko "Possibility of determination of parameters of nanolayers by the modified Kretchman's scheme", Proc. SPIE 4750, ICONO 2001: Quantum and Atomic Optics, High-Precision Measurements in Optics, and Optical Information Processing, Transmission, and Storage, (1 April 2002); https://doi.org/10.1117/12.464472

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available