Paper
1 August 2002 High-performance hierarchical fracturing
Author Affiliations +
Abstract
We describe in more detail a mask data preparation (MDP) flow previously proposed. The focus on this paper is a performance comparison of hierarchical fracturing techniques compared to standard fracturing. Our flow uses GDSII data as input, including a GDSII-based job deck description. The output is maximally compacted, trapezoidal mask writer (MW) formatted data. Our flow takes advantage of hierarchy explicit in the GDSII file(s). This allows optimal determination of 'cover cells', which are repeatable groups of patterns within the data. The use of cover cells allows a reduction of fracturing runtime. In one case, a 21 GB MEBES file was fractured in 30 hours using the standard technique and 53 minutes using the hierarchical cover cell technique.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicolas B. Cobb and Weidong Zhang "High-performance hierarchical fracturing", Proc. SPIE 4754, Photomask and Next-Generation Lithography Mask Technology IX, (1 August 2002); https://doi.org/10.1117/12.476933
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Computer aided design

Medium wave

Photomasks

Data conversion

Visualization

Inspection

Standards development

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