Paper
19 April 2002 New approach for 3D capacitance extractions for complex structures with conformal dielectrics
Andrey Ushakov, Irina Landman, Igor Balk
Author Affiliations +
Proceedings Volume 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002; (2002) https://doi.org/10.1117/12.462829
Event: Symposium on Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, 2002, Cannes-Mandelieu, France
Abstract
This paper describes a new approach for 3-D capacitance extraction using the boundary element method. The new formulation described in this paper improves condition number of the linear system to be solved and reduces the number of unknowns in the system. Implementation of the described method, in conjunction with an acceleration algorithm, will significantly reduce the computational time and memory required for the simulation of electrostatically actuated MEMS devices.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrey Ushakov, Irina Landman, and Igor Balk "New approach for 3D capacitance extractions for complex structures with conformal dielectrics", Proc. SPIE 4755, Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, (19 April 2002); https://doi.org/10.1117/12.462829
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KEYWORDS
Dielectrics

Capacitance

Interfaces

Microelectromechanical systems

Condition numbers

Computer aided design

Computer simulations

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