Analysis of semi-volatile residues using diffuse reflectance infrared Fourier transform spectroscopy

James J. Herrick; James S. Dyer; Adrian R. Guy; Cynthia K. Lee; David M. Soules; Mark S. Anderson

doi:10.1117/12.481658

11 September 2002 Analysis of semi-volatile residues using diffuse reflectance infrared Fourier transform spectroscopy

James J. Herrick, James S. Dyer, Adrian R. Guy, Cynthia K. Lee, David M. Soules, Mark S. Anderson

Proceedings Volume 4774, Optical System Contamination: Effects, Measurements, and Control VII; (2002) https://doi.org/10.1117/12.481658
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

Semi-volatile residues on aerospace hardware can be analyzed using Diffuse Reflectance Infrared Fourier Transform Spectroscopy (DRIFTS). This method can be correlated with quantitative Mil-STD 1246 NVR measurements while simultaneously providing qualitative identification of a large variety of compounds. Its high sensitivity supports the direct sampling of small areas of critical surfaces. This method involves transferring the contaminant film to a small solvent-saturated wipe, followed by extraction of the wipe, then concentration of the solvent extract and subsequent spectroscopic analysis using an FT-IR with a diffuse reflectance accessory. A library of standard curves for different classes of typical aerospace contaminants has been established. Quantitative analysis has been proven successful over orders of magnitude and detection limits exceeding 0.1 ug/cm² are routinely achieved. Several practical applications have been performed using this analytical method and detailed discussion of analysis techniques is presented. The discussion will include: instrumentation setup, selection and preparation of sample collection materials, sample extract preparation, preparation of standard calibration curves and spectral interpretation.

Citation Download Citation

James J. Herrick, James S. Dyer, Adrian R. Guy, Cynthia K. Lee, David M. Soules, and Mark S. Anderson "Analysis of semi-volatile residues using diffuse reflectance infrared Fourier transform spectroscopy", Proc. SPIE 4774, Optical System Contamination: Effects, Measurements, and Control VII, (11 September 2002); https://doi.org/10.1117/12.481658

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