Spatially resolved measurement of slow-axis pseudo near field of diode laser arrays

G. Seewald; Ruediger Grunwald

doi:10.1117/12.474836

17 February 2003 Spatially resolved measurement of slow-axis pseudo near-field of diode laser arrays

G. Seewald, Ruediger Grunwald

Proceedings Volume 4833, Applications of Photonic Technology 5; (2003) https://doi.org/10.1117/12.474836
Event: Applications of Photonic Technology 5, 2002, Quebec City, Canada

Abstract

Pseudo near-field intensity distributions of 1-cm diode-laser bars in slow-axis plane were recorded without parasitic feedback by automated scanning with a slanted highly-reflecting thin metal wire. Irregularities in field patterns are correlated with local curvature and twisting of facets. Information on mode guiding within the semiconductor laser can be derived.

Citation Download Citation

G. Seewald and Ruediger Grunwald "Spatially resolved measurement of slow-axis pseudo near-field of diode laser arrays", Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); https://doi.org/10.1117/12.474836

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