Very high-precision absolute surface metrology gauges for building and qualifying SIM testbed intererometer compound optics

Yekta Gursel

doi:10.1117/12.460882

26 February 2003 Very high precision absolute surface metrology gauges for building and qualifying SIM testbed intererometer compound optics

Yekta Gursel

Author Affiliations +

Proceedings Volume 4852, Interferometry in Space; (2003) https://doi.org/10.1117/12.460882
Event: Astronomical Telescopes and Instrumentation, 2002, Waikoloa, Hawai'i, United States

Abstract

The Stellar Interferometry Mission (SIM) and particularly one of its testbeds require compound optical pieces the construction and qualification of which, in turn, require very high-precision absolute surface metrology gauges. In this paper, the details of the design, construction and performance of a triplet of interferometers capable of performing the required measurements are presented.

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Yekta Gursel "Very high precision absolute surface metrology gauges for building and qualifying SIM testbed intererometer compound optics", Proc. SPIE 4852, Interferometry in Space, (26 February 2003); https://doi.org/10.1117/12.460882

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