Paper
21 March 2003 Recent upgrades of the rotational vibrational-rotational Raman lidar of RASC, Kyoto University, Japan: first results
Andreas Behrendt, Takuji Nakamura, Michitaka Onishi, Toshitaka Tsuda
Author Affiliations +
Proceedings Volume 4893, Lidar Remote Sensing for Industry and Environment Monitoring III; (2003) https://doi.org/10.1117/12.466477
Event: Third International Asia-Pacific Environmental Remote Sensing Remote Sensing of the Atmosphere, Ocean, Environment, and Space, 2002, Hangzhou, China
Abstract
Measurement parameters of the RASC Raman lidar are temperature (in the troposphere and stratosphere measured with rotational Raman (RR) technique, in the stratosphere and mesosphere with integration technique), particle extinction coefficient, particle backscatter coefficient, and water vapor mixing ratio (all measured with Raman lidar technique). Recently, we implemented new interference filters, new data acquisition electronics and - for simultaneous temperature measurements with integration technique - a chopper. With the first two upgrades, the measurement resolution for tropospheric measurements could be improved significantly. Now the 1-sigma statistical uncertainty of the rotational Raman temperature measurements is below 1 K up to about 16 km altitude for, e.g., 7 minutes integration time and a gliding average of 360 m of the data. In this contribution, we discuss the recent technical upgrades and illustrate the performance of the new system with measurement examples.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andreas Behrendt, Takuji Nakamura, Michitaka Onishi, and Toshitaka Tsuda "Recent upgrades of the rotational vibrational-rotational Raman lidar of RASC, Kyoto University, Japan: first results", Proc. SPIE 4893, Lidar Remote Sensing for Industry and Environment Monitoring III, (21 March 2003); https://doi.org/10.1117/12.466477
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KEYWORDS
LIDAR

Raman spectroscopy

Signal detection

Temperature metrology

Backscatter

Photon counting

Analog electronics

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