Highly reliable oxide VCSELs for datacom applications

Ian Aeby; Doug Collins; Brian Gibson; Christopher J. Helms; Hong Q. Hou; Wenlin Lou; David J. Bossert; Charlie X. Wang

doi:10.1117/12.482633

17 June 2003 Highly reliable oxide VCSELs for datacom applications

Ian Aeby, Doug Collins, Brian Gibson, Christopher J. Helms, Hong Q. Hou, Wenlin Lou, David J. Bossert, Charlie X. Wang

Proceedings Volume 4994, Vertical-Cavity Surface-Emitting Lasers VII; (2003) https://doi.org/10.1117/12.482633
Event: Integrated Optoelectronics Devices, 2003, San Jose, CA, United States

Abstract

In this paper we describe the processes and procedures that have been developed to ensure high reliability for Emcore’s 850 nm oxide confined GaAs VCSELs. Evidence from on-going accelerated life testing and other reliability studies that confirm that this process yields reliable products will be discussed. We will present data and analysis techniques used to determine the activation energy and acceleration factors for the dominant wear-out failure mechanisms for our devices as well as our estimated MTTF of greater than 2 million use hours. We conclude with a summary of internal verification and field return rate validation data.

Citation Download Citation

Ian Aeby, Doug Collins, Brian Gibson, Christopher J. Helms, Hong Q. Hou, Wenlin Lou, David J. Bossert, and Charlie X. Wang "Highly reliable oxide VCSELs for datacom applications", Proc. SPIE 4994, Vertical-Cavity Surface-Emitting Lasers VII, (17 June 2003); https://doi.org/10.1117/12.482633

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