Spectrally resolved thermoluminescence data analysis by surface fitting

Arkadiusz Mandowski; Ewa Mandowska; Jozef Swiatek

doi:10.1117/12.519744

22 October 2003 Spectrally resolved thermoluminescence data analysis by surface fitting

Arkadiusz Mandowski, Ewa Mandowska, Jozef Swiatek

Proceedings Volume 5136, Solid State Crystals 2002: Crystalline Materials for Optoelectronics; (2003) https://doi.org/10.1117/12.519744
Event: 2003 Chapter books, 2003, Bellingham, WA, United States

Abstract

Typical analysis of thermoluminescence (TL) data is based on various curve fitting algorithms. Older methods used merely several characteristic points of TL curves as the peak position, inflection points or peak width. This approach is generally not suitable for advanced TL measurements utilizing simultaneous detection of wavelength and intensity of the emitted light. These data are represented in the form of surface in three dimensional coordinates. Spectrally resolved thermoluminescence (TL-3D) contains a lot of information concerning both trapping and recombination states. This new technique requires a novel theoretical approach for extracting from experimental data as much information as possible. In this paper we present new algorithm that we call the 'surface fitting.' TL-3D surface is numerically deconvoluted for individual peaks corresponding to trap levels and recombination centres. To demonstrate possibilities of the method we applied the algorithm to the analysis of TL-3D data of some thermoluminescence detectors based on LiF:Mg luminophor.

Citation Download Citation

Arkadiusz Mandowski, Ewa Mandowska, and Jozef Swiatek "Spectrally resolved thermoluminescence data analysis by surface fitting", Proc. SPIE 5136, Solid State Crystals 2002: Crystalline Materials for Optoelectronics, (22 October 2003); https://doi.org/10.1117/12.519744

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