On-machine measurement with an LTP (long trace profiler)

Sei Moriyasu; Peter Z. Takacs; Jun-ichi Kato; Weimin Lin; Yutaka Yamagata; Hitoshi Ohmori

doi:10.1117/12.509457

22 December 2003 On-machine measurement with LTP (long trace profiler)

Sei Moriyasu, Peter Z. Takacs, Jun-ichi Kato, Weimin Lin, Yutaka Yamagata, Hitoshi Ohmori

Proceedings Volume 5180, Optical Manufacturing and Testing V; (2003) https://doi.org/10.1117/12.509457
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

An on-machine measuring system based on the use of an LTP optical head was developed to accurately measure the slope error and profile error of long parts just after machining. Cylindrical surfaces can be measured completely by steering the beam up the sides of the cylinder with a rotatable mirror. To increase the reliability to measure the cylindrical surfaces, the optical system of the LTP head was improved. A personal computer collects all the data and controls the machine positioning and the beam steering mirror automatically.

Citation Download Citation

Sei Moriyasu, Peter Z. Takacs, Jun-ichi Kato, Weimin Lin, Yutaka Yamagata, and Hitoshi Ohmori "On-machine measurement with LTP (long trace profiler)", Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); https://doi.org/10.1117/12.509457

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