Recent developments of multi-aperture overlap-scanning technique

Mingyi Chen; Hongwei Guo; Yingjie Yu; Haitao He

doi:10.1117/12.505340

22 December 2003 Recent developments of multi-aperture overlap-scanning technique

Mingyi Chen, Hongwei Guo, Yingjie Yu, Haitao He

Proceedings Volume 5180, Optical Manufacturing and Testing V; (2003) https://doi.org/10.1117/12.505340
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

In this paper, the multi-aperture overlap-scanning technique (MAOST) and its recent developments are presented. In the first instance, MAOST is used in interferometry, and the principle of MAOST for interferometry is that, a tested large-scale plane is covered by an array of interferometric subapertures, and the relationship between each couple of adjacent subapertures is determined from their overlapping areas by a least squares method, and then the profile of tested plane is obtained by connecting all the subapertures together. Recently, to meet the requirements of advanced manufacturing, the idea of MAOST has been extended to precision three-dimensional (3-D) measurement. In practice, a whole-body 3-D shape is acquired by two steps: first measuring the 3-D shape from different views and afterwards connecting all the views together. In order to accurately determine the position and orientation of every single-view in a common coordinate system, an iterative algorithm based on MAOST concept is utilized.

Citation Download Citation

Mingyi Chen, Hongwei Guo, Yingjie Yu, and Haitao He "Recent developments of multi-aperture overlap-scanning technique", Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); https://doi.org/10.1117/12.505340

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