Terahertz-regime realization and optical characterization of two-dimensional photonic crystal waveguides on a silicon-on-insulator (SOI) substrate

Chunchen Lin; Caihua Chen; Garrett J. Schneider; Peng Yao; Shouyuan Shi; Ahmed Sharkawy; Dennis W. Prather

doi:10.1117/12.507762

10 November 2003 Terahertz-regime realization and optical characterization of two-dimensional photonic crystal waveguides on a silicon-on-insulator (SOI) substrate

Chunchen Lin, Caihua Chen, Garrett J. Schneider, Peng Yao, Shouyuan Shi, Ahmed Sharkawy, Dennis W. Prather

Author Affiliations +

Proceedings Volume 5181, Wave Optics and Photonic Devices for Optical Information Processing II; (2003) https://doi.org/10.1117/12.507762
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

A terahertz-scale two-dimensional photonic-crystal waveguide based on a silicon-on-insulator was fabricated, and the optical transmission spectrum was measured. Terahertz beam propagation characteristics were observed using a thermal imaging camera, with incident light in the 10.1-10.7μm range. The measured transmission spectrum was in very good agreement with a three-dimensional finite-difference time-domain calculation.

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Chunchen Lin, Caihua Chen, Garrett J. Schneider, Peng Yao, Shouyuan Shi, Ahmed Sharkawy, and Dennis W. Prather "Terahertz-regime realization and optical characterization of two-dimensional photonic crystal waveguides on a silicon-on-insulator (SOI) substrate", Proc. SPIE 5181, Wave Optics and Photonic Devices for Optical Information Processing II, (10 November 2003); https://doi.org/10.1117/12.507762

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KEYWORDS

Waveguides

Terahertz radiation

Photonic crystals

Gas lasers

Transmittance

Silicon

Cameras

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