Paper
26 February 2004 Principles of highest-precision optical parts estimation on the basis of a point-diffraction interferometer
Nikolay B. Voznesensky, Kyeong-Hee Lee, Vladimir K. Kirillovsky
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Abstract
Problem of testing fine optics in industrial conditions with the highest accuracy is considered. Requirements to the quality of optical surfaces and wavefront errors referred to various kinds of optical systems are discussed. The disadvantages of the use of test parts with etalon surfaces in interferometric measurements are considered and the dead circle of the use of the unknown-shaped reference surfaces is revealed. The solution of this problem is proposed through application of the point diffraction interferometer (PDI). The advanced schematic of such an interferometer is presented; unlimited accuracy and industrial testing possibilities of the upgraded Linnik interferometer are discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nikolay B. Voznesensky, Kyeong-Hee Lee, and Vladimir K. Kirillovsky "Principles of highest-precision optical parts estimation on the basis of a point-diffraction interferometer", Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); https://doi.org/10.1117/12.512231
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Interferometers

Wavefronts

Diffraction

Optical testing

Image quality

Optical components

Optics manufacturing

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