Characterization techniques for second-order nonlinear optical materials

Robert C. Eckardt; Gary C. Cattela

doi:10.1117/12.538492

14 June 2004 Characterization techniques for second-order nonlinear optical materials

Robert C. Eckardt, Gary C. Cattela

Proceedings Volume 5337, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications III; (2004) https://doi.org/10.1117/12.538492
Event: Lasers and Applications in Science and Engineering, 2004, San Jose, Ca, United States

Abstract

A review of measurement techniques and nonlinear coefficient values are presented. Coefficients of a few materials are evolving as standards by consensus based on independent measurements. Improved instrumentation, extension of measurement techniques, and more detailed analysis are improving accuracy in recent measurements. Confusion still remains for values of some materials, and specification of the reporting frame for the tensor values remains an issue.

Citation Download Citation

Robert C. Eckardt and Gary C. Cattela "Characterization techniques for second-order nonlinear optical materials", Proc. SPIE 5337, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications III, (14 June 2004); https://doi.org/10.1117/12.538492

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