Phase coexistence and resistance fluctuations in a thin film manganite

Akilan Palanisami; Neil D. Mathur; Michael B. Weissman

doi:10.1117/12.547132

25 May 2004 Phase coexistence and resistance fluctuations in a thin film manganite

Akilan Palanisami, Neil D. Mathur, Michael B. Weissman

Proceedings Volume 5469, Fluctuations and Noise in Materials; (2004) https://doi.org/10.1117/12.547132
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain

Abstract

Resistance fluctuations of low strain thin film La_0.7Ca_0.3MnO₃ grown on NdGaO₃ are examined. The appearance of two state resistance fluctuations are found to be correlated with the onset of remanent magnetization and not with the onset of percolation-like conduction. Their behavior with current, applied magnetic field, and temperature provide information on the nature of the fluctuation. In contrast to the magnetization at the putative T_c of the thin film, the resistance fluctuations display memory of the applied magnetic filed history. An explanation involving a strain enhanced AF interaction is posited.

Citation Download Citation

Akilan Palanisami, Neil D. Mathur, and Michael B. Weissman "Phase coexistence and resistance fluctuations in a thin film manganite", Proc. SPIE 5469, Fluctuations and Noise in Materials, (25 May 2004); https://doi.org/10.1117/12.547132

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