Microscopy of Si and Ge nanospherical particles

Uryi Petrovich Volkov; Vil B. Baibyrin; Roman A. Yakimenko; Nikolai P. Konnov; Andrei P. Mironychev

doi:10.1117/12.568563

14 July 2004 Microscopy of Si and Ge nanospherical particles

Uryi Petrovich Volkov, Vil B. Baibyrin, Roman A. Yakimenko, Nikolai P. Konnov, Andrei P. Mironychev

Proceedings Volume 5475, Saratov Fall Meeting 2003: Coherent Optics of Ordered and Random Media IV; (2004) https://doi.org/10.1117/12.568563
Event: Saratov Fall Meeting 2003, 2003, Saratov, Russian Federation

Abstract

We have fabricated nanometer spherical silicon and germanium particles by dissolving semiconductors in some melted metals (aluminum, indium). The first transmission electron microscopy images and electron microdiffraction patterns of the spherical Si and Ge particles are presented. The obtained spherical particles have sizes from hundreds nanometers to tens angstroms, the diameters of the smallest ones are about 1.5 nm that are close to calculated sizes of hypothetic silicon "fullerenes" Si₆₀.

Citation Download Citation

Uryi Petrovich Volkov, Vil B. Baibyrin, Roman A. Yakimenko, Nikolai P. Konnov, and Andrei P. Mironychev "Microscopy of Si and Ge nanospherical particles", Proc. SPIE 5475, Saratov Fall Meeting 2003: Coherent Optics of Ordered and Random Media IV, (14 July 2004); https://doi.org/10.1117/12.568563

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KEYWORDS

Particles

Silicon

Germanium

Spherical lenses

Aluminum

Transmission electron microscopy

Metals

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