Paper
25 November 1985 A Random Walk through the Field of Speckle
Joseph W. Goodman
Author Affiliations +
Abstract
Tne salient features of "classical" speckle patterns are reviewed. The relaxation of assumptions leading to the classical model yields statistical properties that differ from those associated with conventional speckle. Attention is turned to a summary of those new statistical aspects of speckle that have been discovered or explored since the last SPIE conference on speckle, held in August of 1990.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph W. Goodman "A Random Walk through the Field of Speckle", Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); https://doi.org/10.1117/12.949515
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Cited by 9 scholarly publications.
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KEYWORDS
Speckle

Speckle pattern

Scattering

Sensors

Polarization

Diffusers

Image resolution

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