Paper
31 January 2005 Optical properties of TiO2 and Mn0.2Ti0.8O2 thin films
Shuang Zhang, Hailin Xue, Caixia Liu, Yong Gan, Wei Dong, Xin-Dong Zhang, Wei-You Chen
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Abstract
TiO2 and Mn0.2Ti0.8O2thin films were prepared by sol-gel process and their structural and optical properties were examined. The structural properties of samples were investigated by the X-ray diffraction (XRD) and auto force microscope (AFM). The XRD results showed that TiO2 thin film calcined at 650°C was anatase phase, and Mn0.2Ti0.8O2 thin films calcined at the same temperature was rutile. The AFM results of both samples showed quite a smooth surface. Optical properties of samples were examined by UV absorption spectrum. The absorption edge of Mn0.2Ti0.8O2 red-shifted.
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Shuang Zhang, Hailin Xue, Caixia Liu, Yong Gan, Wei Dong, Xin-Dong Zhang, and Wei-You Chen "Optical properties of TiO2 and Mn0.2Ti0.8O2 thin films", Proc. SPIE 5624, Semiconductor and Organic Optoelectronic Materials and Devices, (31 January 2005); https://doi.org/10.1117/12.574847
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KEYWORDS
Manganese

Thin films

Absorption

Optical properties

Titanium

Ultraviolet radiation

Atomic force microscopy

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