Test method for evaluating optical disk reliability

Mitsuru Irie; Yoshihiro Okino; Takahiro Kubo

doi:10.1117/12.575707

3 January 2005 Test method for evaluating optical disk reliability

Mitsuru Irie, Yoshihiro Okino, Takahiro Kubo

Proceedings Volume 5643, Advances in Optical Data Storage Technology; (2005) https://doi.org/10.1117/12.575707
Event: Photonics Asia, 2004, Beijing, China

Abstract

This study examined a lifetime estimation method for optical disks. It is based on the Eyring acceleration model and statistical analysis. The statistical distribution of life data for the optical disk assumed a lognormal distribution. Analysis of statistical techniques based on the ISO standard is proposed as a life expectancy prediction method for CD-R disks. The standardized life expectancy of an optical disk is defined as the minimum lifetime of 95% survival probability at 25/50%RH with a 95% confidence level. An acceleration test was conducted using a high-density optical disk under stress conditions of temperature and relative humidity. Consequently, we confirmed the capability of this method for estimating life expectancy by considering the stresses of temperature and relative humidity, and providing for a confidence level. The statistical distribution function of optical disk lifetime data must be clarified experimentally to apply this technique to lifetime estimation of optical disks in the future.

Citation Download Citation

Mitsuru Irie, Yoshihiro Okino, and Takahiro Kubo "Test method for evaluating optical disk reliability", Proc. SPIE 5643, Advances in Optical Data Storage Technology, (3 January 2005); https://doi.org/10.1117/12.575707

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