Paper
28 February 2005 Optimization of film thickness for thermoelectric micro-Peltier cooler
Author Affiliations +
Proceedings Volume 5649, Smart Structures, Devices, and Systems II; (2005) https://doi.org/10.1117/12.582256
Event: Smart Materials, Nano-, and Micro-Smart Systems, 2004, Sydney, Australia
Abstract
In this paper, the design of a thin film thermoelectric microcooler module is examined. The module consists of n-type bismuth telluride and p-type antimony telluride thermoelectric materials. The commercial software CFD-ACE+ is used to implement and analyse the model. A two-dimensional coupled electrical and thermal synthesis was performed. The influence of the thickness of the thermoelectric materials on the change in temperature has been investigated. The thickness of the thermoelements was varied between 0.5 and 20 μm. The device performance in terms of change in temperature with and without a load has been studied. The optimal thickness for the thermoelements was found to be 2μm. At 30mA, a temperature difference of 3K below ambient was obtained.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sasikaran Kandasamy, Damien Pachoud, David A. Powell, Kourosh Kalantar-zadeh, Gary Rosengarten, Anthony Stephen Holland, and Wojtek Wlodarski "Optimization of film thickness for thermoelectric micro-Peltier cooler", Proc. SPIE 5649, Smart Structures, Devices, and Systems II, (28 February 2005); https://doi.org/10.1117/12.582256
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Thermoelectric materials

Temperature metrology

Antimony

Bismuth

Tellurium

Semiconductors

Thin films

Back to Top