Paper
24 February 2005 Precision of computer vision systems for real-time inspection of contact wire wear in railways
Susana Borromeo, Jose Luis Aparicio
Author Affiliations +
Proceedings Volume 5679, Machine Vision Applications in Industrial Inspection XIII; (2005) https://doi.org/10.1117/12.587596
Event: Electronic Imaging 2005, 2005, San Jose, California, United States
Abstract
This paper is oriented to study techniques to improve the precision of the systems for wear measurement of contact wire in the railways. The problematic of wear measurement characterized by some important determining factors like rate of sampling and auscultation conditions is studied in detail. The different solutions to resolve the problematic successfully are examined. Issues related to image acquisition and image processing are discussed. Type of illumination and sensors employed, image processing hardware and image processing algorithms are some topics studied. Once analyzed each one factor which have influence on the precision of the measurement system, there are proposed an assembly of solutions that allow to optimize the conditions under which the inspection can be carried out. Part of the development exposed in this paper is the result of an investigation work in a project in collaboration with the Electronic Division of Engineering of the Escuela Técnica Superior de Ingenieros Industriales of the Universidad Politécnica de Madrid and the business RENFE (Spanish Railways Company) that has culminated in a system for measurement of contact wire (MEDES) which actually is been used on the laboratories coach of RENFE and the SNCF (France) The system is European patent.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Susana Borromeo and Jose Luis Aparicio "Precision of computer vision systems for real-time inspection of contact wire wear in railways", Proc. SPIE 5679, Machine Vision Applications in Industrial Inspection XIII, (24 February 2005); https://doi.org/10.1117/12.587596
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CITATIONS
Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Inspection

Computing systems

CCD cameras

Computer vision technology

Image processing

Machine vision

Imaging systems

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