Paper
28 April 2005 Growth and fabrication of AlGaInN-based UV-LEDs using SiN nano-mask technique (Invited Paper)
Y. Naoi, H. Sato, H. Yamamoto, K. Ono, A. Nakamura, M. Kimura, S. Nouda, S. Sakai
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Abstract
370nm AlGaInN-based light emitting diodes (LEDs) with SiN in the active layer, fabricated on sapphire substrates by one-time metal organic chemical vapor deposition (MOCVD) have been investigated. Atomic force microscopy and cathodoluminesence results indicated that SiN nano-mask was formed in the active layer, and the degree of compositional indium fluctuation in the active layer of UV-LEDs was enhanced. By using this technique, the output power of the LEDs was improved about 1.3 times than that of the same structure without SiN in the active layer.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Naoi, H. Sato, H. Yamamoto, K. Ono, A. Nakamura, M. Kimura, S. Nouda, and S. Sakai "Growth and fabrication of AlGaInN-based UV-LEDs using SiN nano-mask technique (Invited Paper)", Proc. SPIE 5722, Physics and Simulation of Optoelectronic Devices XIII, (28 April 2005); https://doi.org/10.1117/12.601958
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Cited by 2 scholarly publications.
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KEYWORDS
Aluminum

Gallium nitride

Light emitting diodes

Metalorganic chemical vapor deposition

Fabrication

Gallium

Atomic force microscopy

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