Measurement of thermal time constant of microbolometer arrays

A. J. Syllaios; Miranda J. Ha; William L. McCardel; Thomas R. Schimert

doi:10.1117/12.603153

31 May 2005 Measurement of thermal time constant of microbolometer arrays

A. J. Syllaios, Miranda J. Ha, William L. McCardel, Thomas R. Schimert

Proceedings Volume 5783, Infrared Technology and Applications XXXI; (2005) https://doi.org/10.1117/12.603153
Event: Defense and Security, 2005, Orlando, Florida, United States

Abstract

A method is described for the direct measurement of the thermal time constant of microbolometer arrays: The emitted radiation from an array due to time varying Joule heating is monitored by a fast photodetector. Applying a bias voltage pulse to the array the thermal time constant is measured from the time dependence of the emission decay at the end of the pulse. In particular, we have used HgCdTe photodetector and digital signal acquisition and analysis to measure the thermal time constant of uncooled a-Si:H microbolometer 120 x 160 arrays with 50 micron pixels. Measured typical thermal time constant values for such arrays are in the range of 8ms to 10ms.

Citation Download Citation

A. J. Syllaios, Miranda J. Ha, William L. McCardel, and Thomas R. Schimert "Measurement of thermal time constant of microbolometer arrays", Proc. SPIE 5783, Infrared Technology and Applications XXXI, (31 May 2005); https://doi.org/10.1117/12.603153

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