Direct spatial-temporal observation of Barkhausen avalanche in low-dimensional ferromagnetic system

Dong-Hyun Kim; Bosun Kang; Weilun Chao; Peter Fischer; Erik Anderson; Sug-Bong Choe; Mi-Young Im; Sung-Chul Shin

doi:10.1117/12.609637

23 May 2005 Direct spatial-temporal observation of Barkhausen avalanche in low-dimensional ferromagnetic system (Invited Paper)

Dong-Hyun Kim, Bosun Kang, Weilun Chao, Peter Fischer, Erik Anderson, Sug-Bong Choe, Mi-Young Im, Sung-Chul Shin

Author Affiliations +

Proceedings Volume 5843, Fluctuations and Noise in Materials II; (2005) https://doi.org/10.1117/12.609637
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States

Abstract

We report our direct observation of the Barkhausen avalanche in ferromagnetic thin film systems, where a collective spin behavior produces nontrivial fluctuations in magnetization change under an external magnetic field. For this study, we develop and use two direct full-field magnetic imaging techniques: magneto-optical microscope magnetometer (MOMM) and magnetic transmission X-ray microscopy (MTXM). From a direct visualization and a statistical analysis of the fluctuating domain images for Co thin films, we investigate the scaling behavior of the Barkhausen avalanche both on spatial and temporal scales using MOMM. We also investigate the reproducibility of the Barkhausen avalanche process. Interestingly, the partially stochastic nucleation behavior is observed for CoCrPt alloy films by means of MTXM on a nanometer scale comparable to the fundamental length scales such as the Barkhausen volume and the grain size of the polycrystalline films. Via these direct full-field observation techniques, dynamic details of Barkhausen avalanche are revealed.

Citation Download Citation

Dong-Hyun Kim, Bosun Kang, Weilun Chao, Peter Fischer, Erik Anderson, Sug-Bong Choe, Mi-Young Im, and Sung-Chul Shin "Direct spatial-temporal observation of Barkhausen avalanche in low-dimensional ferromagnetic system (Invited Paper)", Proc. SPIE 5843, Fluctuations and Noise in Materials II, (23 May 2005); https://doi.org/10.1117/12.609637

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