A new approach of surface roughness measurement using optical method and image processing

K. P. Chaudhary; R. P. Singhal; Shashi K. Singh; Chandera Shakher

doi:10.1117/12.620277

18 August 2005 A new approach of surface roughness measurement using optical method and image processing

K. P. Chaudhary, R. P. Singhal, Shashi K. Singh, Chandera Shakher

Proceedings Volume 5879, Recent Developments in Traceable Dimensional Measurements III; 587914 (2005) https://doi.org/10.1117/12.620277
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

This paper presents a new approach for surface roughness measurement using optical method and image processing. It has an advantage over traditional method where the surface geometry is not touched and line to line scanning is not required. In this system, a CCD camera is used to grab the image of the roughness sample using optical set up along with image processing software and hardware. This paper explains how 3D parameters can be measured to provide greater insight into surface finish. It also includes two cases in which 3D parameters measurements are essential in the design and development of high performance surfaces. Experimental results demonstrated good correlation between the received signal parameters and the root mean square surface roughness. A range of roughness up to 10μm. was detected, with a resolution of 0.01μm.

Citation Download Citation

K. P. Chaudhary, R. P. Singhal, Shashi K. Singh, and Chandera Shakher "A new approach of surface roughness measurement using optical method and image processing", Proc. SPIE 5879, Recent Developments in Traceable Dimensional Measurements III, 587914 (18 August 2005); https://doi.org/10.1117/12.620277

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