Paper
7 February 2006 Direct comparision of the damage frequency method and binary search technique
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Abstract
This paper presents a direct comparison of the two main techniques for the determination of laser damage threshold. The two techniques are compared directly to understand the intrinsic biases of each test and what is causing these biases. The comparison is done in terms of accuracy and repeatability of the resulting measurements. It will be shown that under the vast majority of cases the damage frequency method underestimates the true value and has poor repeatability and that the binary search method over estimates the threshold, but is far more repeatable.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan W. Arenberg "Direct comparision of the damage frequency method and binary search technique", Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 599125 (7 February 2006); https://doi.org/10.1117/12.637602
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Design for manufacturing

Binary data

Laser damage threshold

Laser induced damage

Monte Carlo methods

Convolution

Error analysis

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