Paper
20 January 2006 Study on Fourier transforms profilometry based on bi-color projecting
Author Affiliations +
Proceedings Volume 6027, ICO20: Optical Information Processing; 602715 (2006) https://doi.org/10.1117/12.667936
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
We propose an improved FTP based on bi-color grating projecting. Two individual sinusoidal fringe patterns with π phase difference can be decoded from the deformed bi-color sinusoidal fringe pattern captured by color digital camera. Accessing the two fringe patterns, we can not only eliminate zero order spectra but also automatically build a binary mask at the same time to mark the valid measurement area easily, by which unwrapping phase time is shorten as well as phase error from invalid area is not transferred into valid area; Furthermore, we can easily expand the captured non-full-field deformed fringe pattern to form full field fringe pattern to guarantee frequency resolution.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenjin Chen, Xianyu Su, Yiping Cao, Qiancan Zhang, and Liqun Xiang "Study on Fourier transforms profilometry based on bi-color projecting", Proc. SPIE 6027, ICO20: Optical Information Processing, 602715 (20 January 2006); https://doi.org/10.1117/12.667936
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KEYWORDS
Fringe analysis

Binary data

Fourier transforms

Modulation

Calibration

Phase shift keying

Projection systems

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