Paper
23 January 2006 Na0.5Bi0.5TiO3-based ferroelectric thin films
Zh. Wang, Ch. H. Yang, H. Z. Xu, L. J. Qin, Y. G. Yang
Author Affiliations +
Proceedings Volume 6029, ICO20: Materials and Nanostructures; 60290U (2006) https://doi.org/10.1117/12.667710
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
Sodium bismuth titanate (Na0.5Bi0.5TiO3, NBT) is considered to be an excellent candidate for a lead-free piezoelectric material from the viewpoint of environmental protection. The optimum temperature of crystallinity is 650°C. The films exhibit a well-defined hysteresis loop with a remnant polarization 2Pr of about 1 μC/cm2 and a coercive voltage Vc of approximately 0.9V. The films also show good insulating property at room temperature. The high frequency C-V curve is indicative of good film/substrate interface characteristic. The fixed charge density (Nfc) and the surface state density (Nss) are considered to be adequate for a ferroelectric field effect transistor operation. Electrical measurements results show that this kind of films have a potential practice for device applications such as memory and switching devices.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zh. Wang, Ch. H. Yang, H. Z. Xu, L. J. Qin, and Y. G. Yang "Na0.5Bi0.5TiO3-based ferroelectric thin films", Proc. SPIE 6029, ICO20: Materials and Nanostructures, 60290U (23 January 2006); https://doi.org/10.1117/12.667710
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Cited by 2 scholarly publications.
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KEYWORDS
Thin films

Bismuth

Silicon

Sodium

Crystals

Electrodes

Interfaces

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