Optical properties of light-emitting porous silicon

Fengcheng Teng; Shuxin Qiao; Yanan Cai; Zhiquan Li

doi:10.1117/12.674244

9 June 2006 Optical properties of light-emitting porous silicon

Fengcheng Teng, Shuxin Qiao, Yanan Cai, Zhiquan Li

Proceedings Volume 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 61491K (2006) https://doi.org/10.1117/12.674244
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

Fundamental optical constants of porous silicon, which refer to the effective refractive index n_eff, the extinction coefficient K, the real parts ε_er and imaginary parts ε_ei of the effective dielectric functions, and the absorption coefficient α, are calculated using the effective medium theory named the Modified two-phase Maxell-Garnett and two-phase Bruggeman models separately in the range of 400-1000 nm. In the model, the microstructure of porous silicon is considered as a two-phase granulated compound medium with identical silicon inclusions, placed at random inside a homogenous air matrix. To do the calculation the calculated reflectance spectra from two models are fitted with experiments corresponding to samples with porosities of 39%, 45%, 51%, 59%, and 67% in order to determine the involved parameters in dielectric function called Wemple-DiDomenico oscillator of the remaining silicon. Best results of both models are obtained using spheroidal inclusions of 0.9 eccentricity. Effects of the wavelength of incident light and the porosity of porous silicon on these optical constants were studied systematically.

Citation Download Citation

Fengcheng Teng, Shuxin Qiao, Yanan Cai, and Zhiquan Li "Optical properties of light-emitting porous silicon", Proc. SPIE 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 61491K (9 June 2006); https://doi.org/10.1117/12.674244

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KEYWORDS

Silicon

Reflectivity

Dielectrics

Oscillators

Optical properties

Statistical modeling

Refractive index

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