Single-beam two-photon recording and one-photon fluorescent reading three-dimensional optical data storage system

Huohong Tang; Hui Xing; Bing Jiang; Jianwen Cai; Wenhao Huang; Andong Xia

doi:10.1117/12.676735

23 February 2006 Single-beam two-photon recording and one-photon fluorescent reading three-dimensional optical data storage system

Huohong Tang, Hui Xing, Bing Jiang, Jianwen Cai, Wenhao Huang, Andong Xia

Author Affiliations +

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61504U (2006) https://doi.org/10.1117/12.676735
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

A scheme of three-dimensional optical data storage based on single-beam femotsecond (fs) laser two-photon recording and one-photon fluorescent readout has been developed. A mode-locked Ti: sapphire fs laser beam of pulse width 80fs at a repetition rate of 80MHz and a wavelength of 800nm was used for two-photon recording and a CW laser with a wavelength of 532nm was used for one-photon fluorescent readout. Thus, data bits can be recorded and retrieved inside a photochromic molecule doped polymethylmethacrylate (PMMA) storage medium. With a 0.65 NA objective used for recording and readout, the effects of writing power and exposure time on the spatial resolution of the system were explored. Bit sizes were observed to increase exponentially in size with excitation power and linearly in size with exposure time approximately. The multilayer capability of the system for three-dimensional optical memory was demonstrated and experimental results of eight-layer data inside a diarylethene derivative doped PMMA storage medium were presented.

Citation Download Citation

Huohong Tang, Hui Xing, Bing Jiang, Jianwen Cai, Wenhao Huang, and Andong Xia "Single-beam two-photon recording and one-photon fluorescent reading three-dimensional optical data storage system", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61504U (23 February 2006); https://doi.org/10.1117/12.676735

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