Image metrics for the automated alignment of microtomography data

Tilman Donath; Felix Beckmann; Andreas Schreyer

doi:10.1117/12.679101

7 September 2006 Image metrics for the automated alignment of microtomography data

Tilman Donath, Felix Beckmann, Andreas Schreyer

Proceedings Volume 6318, Developments in X-Ray Tomography V; 631818 (2006) https://doi.org/10.1117/12.679101
Event: SPIE Optics + Photonics, 2006, San Diego, California, United States

Abstract

The position of the rotation axis (center of rotation) is an important input parameter for the reconstruction of tomography data. We have recently presented a method for the determination of the center of rotation from sinogram data recorded in parallel-beam tomography, which is based on scoring of reconstructions with image metrics. The influence of noise on the metric value is investigated by simulation using a circular computer phantom. Limits on the precision of the method are discussed by calculation of the metric signal and its noise level. It is shown that for typical count rates and resolutions used in microtomographic imaging, the method enables to determine the center of rotation with a precision of better than 0.06 pixel.

Citation Download Citation

Tilman Donath, Felix Beckmann, and Andreas Schreyer "Image metrics for the automated alignment of microtomography data", Proc. SPIE 6318, Developments in X-Ray Tomography V, 631818 (7 September 2006); https://doi.org/10.1117/12.679101

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