Temperature compensation of step recovery diode in fast sampling circuits

Aleksander Burd; Katarzyna Opalska

doi:10.1117/12.714693

12 October 2006 Temperature compensation of step recovery diode in fast sampling circuits

Aleksander Burd, Katarzyna Opalska

Proceedings Volume 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006; 63472G (2006) https://doi.org/10.1117/12.714693
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 2006, Wilga, Poland

Abstract

The paper concerns temperature compensation of time delay in ultra fast sampling circuits, used in digital oscilloscopes of gigahertz bandwidth. The main source of thermal instability appears to be step recovery diode used for sampling pulses generation, so the effort was taken toward assuring invariance of its delay regardless of operating temperature. The idea was successfully tested in the proposed circuit for diode polarisation and compensation.

Citation Download Citation

Aleksander Burd and Katarzyna Opalska "Temperature compensation of step recovery diode in fast sampling circuits", Proc. SPIE 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 63472G (12 October 2006); https://doi.org/10.1117/12.714693

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available